IEEE+RFID+2010

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Supply Chain Control Using a RFID Proxy Re-Signature Scheme Trevor Burbridge (BT Research, UK); Andrea Soppera (BT Research, UK)

Privacy-preserving Clone Detection for RFID-enabled Supply Chains Davide Zanetti (ETHZ, CH); Leo Fellmann (ETHZ, CH); Srdjan Capkun (ETH Zurich, CH)

Real time detection and tracking of gauzes by RFID UWB Technique Laura Pierucci (University of Florence, IT); Sergio Boncinelli (CESPRO, IT); Paolo Citti (University of Florence, IT); Enrico Del Re (University of Florence, IT); Gianni Campatelli (University of Florence, IT); Leonardo Bocchi (University of Florence, IT)

The “Weak Spots” in Stacked UHF RFID Tags in NFC Applications Xiaosheng Chen (HK R&D Centre for LSCM Enabling Technologies, HK); Feng Lu (HK R&D Centre for LSCM, HK); Terry Ye (Hong Kong R/D Center for Logistics and Supply Chain Management, HK)

RFID-Based Electronic Voting: What Could Possibly Go Wrong? Yossef Oren (Tel Aviv University, IL); Avishai Wool (Tel Aviv University, IL)

Accurate Localization of RFID Tags Using Phase Difference Cory Hekimian-Williams (Florida State University, US); Brandon Grant (Florida State University, US); Xiuwen Liu (Florida State University, US); Zhenghao Zhang (Florida State University, US); Piyush Kumar (Florida State University, US)

UHF RFID Based Tracking of Logs in the Forest Industry Janne Häkli (VTT, FI); Kaarle Jaakkola (VTT, FI); Pekka Pursula (VTT, FI); Miika Huusko (VTT, FI); Kaj Nummila (VTT, FI)

RFID Tag Antenna Based Sensing: Does your Beverage Glass need a Refill? Rahul Bhattacharyya (Massachusetts Institute of Technology, US); Christian Floerkemeier (MIT, US); Sanjay Sarma (MIT Auto-ID Center, US)

Blocking Reader: Design and Implementation of a Low-Cost Passive UHF RFID Blocking Reader Gaurov Narayanaswamy (University of Texas Arlington, US); Shesh Kumar Jagannatha (University of Texas Arlington, US); Daniel W Engels (Revere Security, US)

RFID Tag Antenna Based Temperature Sensing Rahul Bhattacharyya (Massachusetts Institute of Technology, US); Christian Floerkemeier (MIT, US); Sanjay Sarma (MIT Auto-ID Center, US)